(604f) Characterization of As-Prepared Polymeric Films By Simultaneously Measuring the Glass Transition, Crystallinity, and Order-Disorder Transition through the Restitution
AIChE Annual Meeting
2022
2022 Annual Meeting
Materials Engineering and Sciences Division
Polymer Viscoelasticity: Mechanics, Processing, and Rheology I
Thursday, November 17, 2022 - 9:30am to 9:45am
However, conventional techniques like differential scanning calorimetry (DSC), dynamic mechanical analysis (DMA), and X-ray diffraction (XRD) have some inconveniences in measuring those properties at the same cycle of measurement. For example, with DSC, it is difficult to detect Tg of intrinsically rigid semi-crystalline polymers due to their restricted segmental motion and the enthalpy of fusion value of 100% crystalline polymer is required to calculate Xc. DMA necessitates a relatively larger amount of sample for the measurement, and XRD is not always easily available.
As a result, based on the Hertz contact theory and rheology, we developed a new intuitive technique to simultaneously measure Tg, Xc, and TODT with a relatively small amount of sample (<1 mg). It is well-known that material properties can be observed by measuring the response to external stress and the restitution height and rheology are highly related. Therefore, we investigated the relative elastic response of polymers with respect to their glassy state by measuring the rebound of a ball on intact polymeric films while varying the temperature. With various amorphous and semi-crystalline polymers, including BCPs and intrinsically rigid conjugated polymers, we showed that Tg can be determined by the onset of the dramatic decrease in restitution, Xc is the normalized minimum restitution for Xc up to 50%, and TODT is related to another restitution decreasing point at higher temperatures. All the measured Tgs, Xcs, and TODTs by the ball collision method matched well with the theoretically expected and/or well-known values measured by the conventional techniques. We further quantitatively analyzed the effect of film thickness and an approach to measure Tg, Xc, and TODT of sub-micrometer-thick films will also be discussed.
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