(375u) Time-Series Multiscale Computational Fluid Dynamics Data Modeling with Transformers for Atomic Layer Processing | AIChE

(375u) Time-Series Multiscale Computational Fluid Dynamics Data Modeling with Transformers for Atomic Layer Processing

Authors 

Wang, H. - Presenter, University of California, Los Angeles
Ou, F., University of California, Los Angeles
Suherman, J., UCLA
Tom, M., University of California, Los Angeles
Orkoulas, G., Widener University
Christofides, P., University of California, Los Angeles
Atomic layer processing is a crucial procedure in which thin film coatings are deposited or etched onto transistor surfaces to reduce short-channel effects and maintain robust properties for finished semiconductor materials. Through this manner, monolayers of high-κ oxide films are deposited or etched in sequential cycles in a self-limiting behavior. However, maintaining this self-limiting tendency is a challenging task due to the lack of available data for process optimization and the difficulties attributed to process scale up from experimental scales. With the integration of micro-electromechanical systems (MEMS), on-line data can be extracted in discrete time steps by sensors to generate time-series data that is effective at observing the temporal behavior of the process in real-time [1]. An advantageous feature of time-series data is the ability to predict operating conditions of the reactor for subsequent times [2], which is applicable to the integration of online feedback control and model predictive control for these atomic layer processes. However, there are limitations in obtaining time-series data from experimental contexts, especially for processes that have not been integrated into industrial practice. Thus, in silico modeling is a beneficial route toward the generation of meaningful data that is reflective of processes in industry.

For this work, a two-dimensional multiscale computational fluid dynamics (CFD) model that establishes a codependent framework between mesoscopic kinetic Monte Carlo (kMC) and macroscopic CFD simulations is employed to produce time-series data for a range of operating conditions (e.g., precursor flow rates) and reactor configurations (e.g., gap distances). This multiscale CFD model will integrate a previously developed thermal atomic layer etching process for the etching of Al2O3 films [3] to extract meaningful spatiotemporal data at various simulation settings. However, multiscale CFD modeling is a time-consuming task that requires an abundance of computational resources to produce data efficiently. Thus, a predictive model trained on this spatiotemporal data is vital to pursuing operational decision-making tasks for reactor configurations that have not yet been established. To facilitate the process of building a predictive model, a transformer is employed due to its outperforming of state-of-the-art methods in natural language processing [4]. Lastly, a comparison of various aggregated- and singular-tool models are also conducted to determine the accuracy of the prediction made by the transformer models.

[1] Cheng, C. L., Chang, H. C., Chang, C. I., Fang, W., 2015. Development of a CMOS MEMS pressure sensor with a mechanical force-displacement transduction structure. Journal of Micromechanics and Microengineering, 25, 125024.

[2] Ahn, J., Kim, H.-Y., Cho, S.-H., Kim, H.-J., Kim, H., Choi, H., Ham, D., 2023. Semiconductor equipment health monitoring with multi-view data, In: Winter Simulation Conference (WSC), 2322–2332, San Antonio, TX, USA.

[3] Yun, S., Tom, M., Ou, F., Orkoulas, G., Christofides, P. D., 2022. Multiscale computational fluid dynamics modeling of thermal atomic layer etching: Application to chamber configuration design. Computers & Chemical Engineering, 161, 107757.

[4] Zhang, C., Yella, J., Huang, Y., Qian, X., Petrov, S., Rzhetsky, A., Bom, S., 2021. Soft sensing transformer: Hundreds of sensors are worth a single word. In: 2021 IEEE International Conference on Big Data (Big Data), 1999–2008, Orlando, FL, USA.