(485c) Atomic-Scale Analysis Of Structural And Mechanical Properties Of Ultra-Low-Dielectric-Constant Mesoporous Amorphous Silica Films | AIChE

(485c) Atomic-Scale Analysis Of Structural And Mechanical Properties Of Ultra-Low-Dielectric-Constant Mesoporous Amorphous Silica Films

Authors 

Gungor, M. R. - Presenter, University of Massachusetts Amherst
Maroudas, D. - Presenter, University of Massachusetts