(584g) Deep Learning for Pyrolysis Reactor Monitoring: From Thermal Imaging Towards Smart Monitoring System
AIChE Annual Meeting
2018
2018 AIChE Annual Meeting
Computing and Systems Technology Division
Process Monitoring & Fault Detection
Wednesday, October 31, 2018 - 5:00pm to 5:15pm
Recent years, data-driven approaches using machine learning algorithms and statistics have been widely applied in feature learning. As the most advanced branch in machine learning, deep learning (DL) methods bring huge breakthroughs in many areas particularly for image analysis. In our work, based on the infrared thermography, we opted a deep convolutional neural network (DCNN) to build a monitoring system for the surface temperature and shape changing of pyrolysis tubes inside the fired furnace. To recognize the tube regions from the bulk background, a 50-layer ResNet[1] was used to segment tube areas from the raw images. In order to transfer the image classification model into a segmentation model, the strategy of fully convolutional network (FCN)[2] was applied in the ResNet model that tube areas are predicted by the upsampling of multiple-layer feature maps in the ResNet. After the segmentation of detailed tube regions, detailed surface temperature and area of the tube can be identified from the raw photos. Therefore, a monitoring system can be constructed where process operators can easily observe the overheated areas and shape changes through such system. Besides the monitoring efforts by operators, an automatic monitoring system can be further composed by the introduction of multivariate statistics. In this work, a PCA-based monitoring model[3] is introduced to detect faulty conditions from the information provided by six infrared cameras. The monitoring system successfully identified the overheated spots on the tube, as well as abnormal vibration of one infrared camera due to installation problem. This work provides contribution of combining state-of-the-art DL approaches into industrial monitoring systems.
[1] K. He, X. Zhang, S. Ren, and J. Sun, âDeep Residual Learning for Image Recognition,â in 2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 2016, pp. 770â778.
[2] J. Long, E. Shelhamer, and T. Darrell, âFully convolutional networks for semantic segmentation,â Proc. IEEE Comput. Soc. Conf. Comput. Vis. Pattern Recognit., vol. 07-12-June-2015, pp. 3431â3440, 2015.
[3] L. H. Chiang, E. Russell, and R. D. Braatz, âFault detection and diagnosis in industrial systems,â Time, vol. 12, no. 10â11, pp. 285â294, 2001.
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