(6fp) Using in-Situ X-Ray Analysis Techniques to Understand Materials Synthesis | AIChE

(6fp) Using in-Situ X-Ray Analysis Techniques to Understand Materials Synthesis

Authors 

Research Interests: My research interest focuses on in-situ characterization during the synthesis of inorganic functional materials. Currently, many novel functional materials are being synthesized, while the progression from precursors to products is usually not very well-understood. My goal is utilizing in-situ characterization techniques, especially X-ray scattering and spectroscopy, to track synthesis reactions in real-time and investigate the growth of materials from nucleation to crystallization. In-situ experiments will enable us to resolve the intermediate species or key reaction steps in the reaction, and will provide valuable insights into why and how certain materials can be synthesized under which reaction conditions. Ultimately, this information serves as critical references for a.) Achieving precise control of chemical composition, phase, and morphology of targeted materials, b.) Developing alternative synthesis methods that are less energy-consuming, and c.) Guiding the discovery of new functional materials.

Teaching Interests: I am enthusiastic about teaching materials and surface characterization techniques at both undergraduate and graduate level. My experience working in ultra-high vacuum facilities and synchrotron radiation centers provides me a solid background in surface science and X-ray characterization methods. Therefore, I am highly interested in opening an introductory class to the principle and applications of commonly utilized characterization techniques, such as electron microscopy, X-ray diffraction, and spectroscopy. Meanwhile, based on my research interests, I also hope to open an advanced class about state-of-art X-ray analysis techniques being performed in synchrotron radiation facilities. I would like to introduce real-life examples on analysis that requires specific measurement conditions, for example, performing time-resolved in-situ analysis with a wave-length adjustable, high-brightness X-ray light source.