(467c) Comparing in Situ Particle Characterization Probes
AIChE Annual Meeting
2023
2023 AIChE Annual Meeting
Separations Division
PAT and Process Monitoring in Crystallization Development and Manufacturing
Thursday, November 9, 2023 - 4:09pm to 4:27pm
After a significant period of slow development of Process Analytical Technology (PAT) probes used to characterize particles in the dense suspensions typical of operation of industrial crystallization processes, there has been a period of more rapid development with several relatively new offerings. In this work, we compare the measurements provided by two new imaging probes that also provide particle size information, the Mettler-Toledo EasyViewer® and the BlazeMetrics Blaze® probe with a legacy particle size measurement probe, the Mettler-Toledo ParticleTrack®. Several model particle systems are measured at various concentrations and a range of particle habits, including reference spheres of known size.