Process monitoring & fault detection II | AIChE

Process monitoring & fault detection II

Chair(s)

Singh, R., Rutgers, The State University of New Jer

Co-chair(s)

Yin, X., Nanyang Technological University

This session seeks novel contributions in the broad areas of process monitoring, fault detection, isolation, estimation and accommodation in process systems. Both data-driven and model-based approaches are welcome. Applications to industrial processes are encouraged.

Presentations

Checkout

Paper abstracts are public but to access Extended Abstracts, you must first purchase the conference proceedings.

Checkout

Do you already own this?

Pricing

Individuals

AIChE Pro Members $150.00
AIChE Emeritus Members $105.00
AIChE Graduate Student Members Free
AIChE Undergraduate Student Members Free
AIChE Explorer Members $225.00
Non-Members $225.00