(70k) The Use of Focused Ion Beams for the Characterization of Industrial Mineral Microparticles -

Detailed information about the external and internal structure of microparticles plays an important role in the development of new materials. Scanning electron microscopy (SEM) can be used for studying the external structure of particles and transmission electron microscopy (TEM) can be used to identify some aspects of the internal structure of particles. However, neither technique really characterizes the internal structure of kaolin particles. Thermal treatment or calcination of kaolin alters the internal structure and being able to characterize these changes has always been a challenge. In recent years, the ability of a focused ion beam (FIB) to cross-section single particles thus exposing their internal structure has raised increasing interest. This conference poster describes how a FIB is successfully used to (i) analyse the effect of soak and flash calcining on the internal structure of kaolin and (ii) to characterize the internal structure of some other industrial mineral microparticles.

Keywords: Focused Ion Beam; Internal Structure; Flashed Calcined Kaolin