(54d) Investigating Mechanical Properties of Surfactant Films at the Solid-Liquid Interface Using AFM
World Congress on Particle Technology
2018
8th World Congress on Particle Technology
Poster Sessions
World Congress on Particle Technology Poster Session
Tuesday, April 24, 2018 - 11:45am to 1:15pm
Atomic force microscopy (AFM) is an effective tool to study the barrier properties of surfactant films at the solid-liquid interface. Determination of mechanical and topographical properties of single and mixed surfactant coatings by atomic force microscopy (AFM) can delineate the role of physical vs. electrochemical barrier by such films in the corrosion inhibition process. . So far, the AFM data, obtained using a closed cell, indicate the effect of surfactant concentration and that of hydrocarbon chains interactions on the mechanical properties of cationic surfactant films. Ultimately, integration of the AFM and electrochemical results will reveal the correlation between the surfactant structures at the solid-liquid interface and their corrosion inhibition efficacy.