Efficient Surrogate Model Development: Impact of Sample Size and Underlying Model Dimensions | AIChE

Efficient Surrogate Model Development: Impact of Sample Size and Underlying Model Dimensions

TitleEfficient Surrogate Model Development: Impact of Sample Size and Underlying Model Dimensions
Publication TypeJournal Article
Year of Publication2018
AuthorsDavis, SE, Cremaschi, S, Eden, MR
JournalComputer Aided Chemical Engineering
Volume44
Pagination979-984
Date Publishedjan
Keywords9.3, Modeling and Simulation, optimization, process design, Project 9.3, surrogate model
Abstract

This study compares eight surrogate-model construction approaches using computational experiments. The construction approaches considered include: Artificial Neural Networks (ANNs), Automated Learning of Algebraic Models using Optimization (ALAMO), Radial Basis Networks (RBNs), Extreme Learning Machines (ELMs), Gaussian Progress Regression (GPR), Random Forests (RFs), Support Vector Regression (SVR), and Multivariate Adaptive Regression Splines. Each approach is used to construct surrogate models for predicting the outputs of thirty-four test functions. The data used to construct surrogate models were generated using Latin Hypercube Sampling (LHS), Halton and Sobol sampling methods. We studied the impact of sampling method, sample size, and challenge function characteristics on the accuracy of surrogate model predictions. Our results revealed that for smaller sample sizes, on average, surrogate models trained using the data points generated by Sobol sequences provided the best estimation for all surrogate model construction approaches. As the sample size increased, the impact of sampling methods diminished. The comparison of surrogate-modeling construction approaches at large sample sizes revealed that surrogate models trained using ANN, ALAMO, and ELM yielded smaller root mean squared error and higher adjusted R-squared values than the models trained using the rest of the approaches.

URLhttps://www.sciencedirect.com/science/article/abs/pii/B9780444642417501580?via=ihub
DOI10.1016/B978-0-444-64241-7.50158-0