(9b) Summary of the Panel Discussion “Using Credible Failure Rates for SIS Ensures Process Safety”

On March 13, 2023, in conjunction with the 19^th Global Congress on Process Safety, the authors will gather to participate in a panel session. The discussion will center on the premise that many individual device failure rates published by manufacturers and certifying agencies are deemed, by members of the panel, many SIF designers, and practicing engineers in the field, to be too low. This is especially true for mechanical final elements. SIFs designed using these unrealistic failure rates often result in SIL levels on paper which would be achievable only under the most optimistic assumptions regarding installation, operation, and maintenance. These SIL levels are not likely to be achieved in the field. The panel will discuss the underlying causes of this serious safety issue and propose some possible solutions. The accompanying paper will summarize the panel discussion among the four authors/panelists. Relevant graphics shown during the discussion and appropriate verbatim quotations will be included.